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Minne, Stephen C.; Manalis, Scott R. (Massachusetts Institute Of Technology, Cambridge, Usa); Quate, Calvin F. (Stanford University, California, Usa) - Bringing Scanning Probe Microscopy Up to Speed - 9780792384663 - V9780792384663
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Bringing Scanning Probe Microscopy Up to Speed

€ 124.98
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Description for Bringing Scanning Probe Microscopy Up to Speed Hardback. Introduces the principles of scanning probe systems focusing on techniques for increasing speed. This book includes information on the characteristics and limitations of machines as well as the properties of the systems that follow in the future. Series: Microsystems. Num Pages: 159 pages, biography. BIC Classification: PDND; TJFD5. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 426.
Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
The key components of the SPM are the mechanical microcantilever with integrated tip ... Read more

Product Details

Format
Hardback
Publication date
1999
Publisher
Kluwer Academic Publishers United States
Number of pages
159
Condition
New
Series
Microsystems
Number of Pages
159
Place of Publication
Dordrecht, Netherlands
ISBN
9780792384663
SKU
V9780792384663
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

Reviews for Bringing Scanning Probe Microscopy Up to Speed
`The presentation is clear and easy to follow, written by hands-on persons. There is a wealth of technical detail and useful diagrams. ...for persons who are serious fabricators of SPM...it is essential reading.' The Physicist, 37:2 (2000)

Goodreads reviews for Bringing Scanning Probe Microscopy Up to Speed


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