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Characterization Methods of Submicron MOSFETs
Hisham . Ed(S): Haddara
€ 185.28
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Description for Characterization Methods of Submicron MOSFETs
Hardback. Deals with techniques which show high potential for characterization of submicron devices. This book focuses on the adaptation of such methods to resolve measurement problems relevant to VLSI devices and new materials, especially Silicon-on-Insulator (SOI). Editor(s): Haddara, Hisham. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 232 pages, biography. BIC Classification: TJFD5. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 1170.
It is true that the Metal-Oxide-Semiconductor Field-Eeffect Transistor (MOSFET) is a key component in modern microelectronics. It is also true that there is a lack of comprehensive books on MOSFET characterization in gen eral. However there is more than that as to the motivation and reasons behind writing this book. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements which made the task of MOSFET characterization more and more crucial as well as difficult. The progressive miniaturization of devices has caused several phenomena to emerge and modify the performance of scaled-down MOSFETs. Localized ... Read more
It is true that the Metal-Oxide-Semiconductor Field-Eeffect Transistor (MOSFET) is a key component in modern microelectronics. It is also true that there is a lack of comprehensive books on MOSFET characterization in gen eral. However there is more than that as to the motivation and reasons behind writing this book. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements which made the task of MOSFET characterization more and more crucial as well as difficult. The progressive miniaturization of devices has caused several phenomena to emerge and modify the performance of scaled-down MOSFETs. Localized ... Read more
Product Details
Format
Hardback
Publication date
1996
Publisher
Kluwer Academic Publishers United States
Number of pages
232
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
232
Place of Publication
Dordrecht, Netherlands
ISBN
9780792396956
SKU
V9780792396956
Shipping Time
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Ref
99-15
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