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Jiann-Shiun Yuan - CMOS RF Circuit Design for Reliability and Variability - 9789811008825 - V9789811008825
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CMOS RF Circuit Design for Reliability and Variability

€ 71.18
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Description for CMOS RF Circuit Design for Reliability and Variability Paperback. Series: SpringerBriefs in Applied Sciences and Technology. Num Pages: 112 pages, 101 black & white illustrations, biography. BIC Classification: TJFC; TJFN. Category: (G) General (US: Trade). Dimension: 235 x 155 x 6. Weight in Grams: 186.
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability ... Read more

Product Details

Format
Paperback
Publication date
2016
Publisher
Springer Verlag, Singapore Singapore
Number of pages
112
Condition
New
Series
SpringerBriefs in Applied Sciences and Technology
Number of Pages
106
Place of Publication
Singapore, Singapore
ISBN
9789811008825
SKU
V9789811008825
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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