CTL for Test Information of Digital ICS
Rohit Kapur
€ 125.45
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Description for CTL for Test Information of Digital ICS
Hardback. From the reviews: "[!] a welcome addition to the literature. [!] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability Num Pages: 173 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 12. Weight in Grams: 444.
CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL.
CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the ... Read more
CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL.
CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the ... Read more
Product Details
Format
Hardback
Publication date
2002
Publisher
Kluwer Academic Publishers United States
Number of pages
173
Condition
New
Number of Pages
173
Place of Publication
New York, NY, United States
ISBN
9781402072932
SKU
V9781402072932
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for CTL for Test Information of Digital ICS
From the reviews: "The book is a welcome addition to the literature. It is definitely useful as a reference for anyone who is interested in creating test programs for SoC designs. This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library ... Read more