Stock image for illustration purposes only - book cover, edition or condition may vary.
Digital Systems Testing and Testable Design
Miron Abramovici
€ 210.99
FREE Delivery in Ireland
Description for Digital Systems Testing and Testable Design
Hardcover. Num Pages: 672 pages, illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XV) Technical / Manuals. Dimension: 271 x 187 x 40. Weight in Grams: 1338.
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Product Details
Format
Hardback
Publication date
1994
Publisher
I.E.E.E.Press United States
Number of pages
672
Condition
New
Number of Pages
672
Place of Publication
, United States
ISBN
9780780310629
SKU
V9780780310629
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Miron Abramovici
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago. Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles. Arthur D. Friedman ... Read more
Reviews for Digital Systems Testing and Testable Design