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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Jose Pineda de Gyvez
€ 125.35
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Description for Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Hardback. Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. This title reviews the importance of a defect-sensitivity analysis in contemporary VLSI design procedures. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 167 pages, 48 black & white illustrations, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 12. Weight in Grams: 1000.
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept ... Read more
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept ... Read more
Product Details
Format
Hardback
Publication date
1992
Publisher
Kluwer Academic Publishers United States
Number of pages
167
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
167
Place of Publication
Dordrecht, Netherlands
ISBN
9780792393061
SKU
V9780792393061
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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