Microwave Electronics: Measurement and Materials Characterization
L. F. Chen
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Description for Microwave Electronics: Measurement and Materials Characterization
Hardcover. Microwave materials are used in applications ranging from personal communication devices to military satellite services. The increasing requirement for the development of high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This book discusses about microwave electronics. Num Pages: 552 pages, Illustrations. BIC Classification: TJFN. Category: (P) Professional & Vocational. Dimension: 253 x 193 x 35. Weight in Grams: 1196.
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
- Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
- Examines every aspect of microwave material properties, circuit design and applications.
- Presents materials property characterisation methods along with a discussion of ... Read more
- Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
- Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
Show LessProduct Details
Format
Hardback
Publication date
2004
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
552
Condition
New
Number of Pages
552
Place of Publication
New York, United States
ISBN
9780470844922
SKU
V9780470844922
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About L. F. Chen
L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. V. V. Varadan is the author ... Read more
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