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Physical Limitations of Semiconductor Devices
Vashchenko, Vladislav A.; Sinkevitch, V.F.
€ 120.53
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Description for Physical Limitations of Semiconductor Devices
Hardback. Providing an important link between the theoretical knowledge in the field of non-linear physics and practical application problems in microelectronics, this book highlights the physical approach for reliability assurance. Num Pages: 330 pages, 5 black & white tables, biography. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 25. Weight in Grams: 679.
Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic ... Read more
Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic ... Read more
Product Details
Format
Hardback
Publication date
2008
Publisher
Springer-Verlag New York Inc. United States
Number of pages
330
Condition
New
Number of Pages
330
Place of Publication
New York, NY, United States
ISBN
9780387745138
SKU
V9780387745138
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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