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Soft Error Mechanisms, Modeling and Mitigation
Selahattin Sayil
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Description for Soft Error Mechanisms, Modeling and Mitigation
Hardback. Num Pages: 116 pages, 46 black & white illustrations, 35 colour illustrations, 44 colour tables, biography. BIC Classification: TJFC; UYF. Category: (G) General (US: Trade). Dimension: 235 x 155 x 8. Weight in Grams: 350.
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also ... Read more
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also ... Read more
Product Details
Format
Hardback
Publication date
2016
Publisher
Springer International Publishing AG Switzerland
Number of pages
116
Condition
New
Number of Pages
105
Place of Publication
Cham, Switzerland
ISBN
9783319306063
SKU
V9783319306063
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Selahattin Sayil
Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
Reviews for Soft Error Mechanisms, Modeling and Mitigation
“Book gives wide perspectives on the technical insights of fundamentals of sources and mitigation strategies of soft error rates in semiconductor memory devices … . a valuable addition to a scientific library, as well as served as good introduction for memory reliability engineers or specialists and industrials involved in the field of memory device reliability. This book is highly recommended ... Read more