×


 x 

Shopping cart
Jose L. . Ed(S): Huertas - Test and Design-for-Testability in Mixed-Signal Integrated Circuits - 9781402077241 - V9781402077241
Stock image for illustration purposes only - book cover, edition or condition may vary.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

€ 191.24
FREE Delivery in Ireland
Description for Test and Design-for-Testability in Mixed-Signal Integrated Circuits hardcover. Deals with test and design for test of analog and mixed-signal integrated circuits. This book presents the topic of standardization, with focus on the IEEE 1149.4. Also addressed is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Editor(s): Huertas, Jose L. Num Pages: 298 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 297 x 210 x 19. Weight in Grams: 620.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to ... Read more

In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters.

In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Show Less

Product Details

Format
Hardback
Publication date
2004
Publisher
Springer United States
Number of pages
298
Condition
New
Number of Pages
298
Place of Publication
New York, NY, United States
ISBN
9781402077241
SKU
V9781402077241
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

Reviews for Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Goodreads reviews for Test and Design-for-Testability in Mixed-Signal Integrated Circuits


Subscribe to our newsletter

News on special offers, signed editions & more!