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Unified Methods for VLSI Simulation and Test Generation
Cheng, Kwang-Ting; Agrawal, Vishwani D.
€ 124.81
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Description for Unified Methods for VLSI Simulation and Test Generation
Hardback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 148 pages, biography. BIC Classification: TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 410.
Product Details
Format
Hardback
Publication date
1989
Publisher
Kluwer Academic Publishers United States
Number of pages
148
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
148
Place of Publication
Dordrecht, Netherlands
ISBN
9780792390251
SKU
V9780792390251
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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