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Extreme Statistics in Nanoscale Memory Design
. Ed(S): Singhee, Amith; Rutenbar, Rob A.
€ 199.00
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Description for Extreme Statistics in Nanoscale Memory Design
Hardback. This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community. Editor(s): Singhee, Amith; Rutenbar, Rob A. Series: Integrated Circuits and Systems. Num Pages: 246 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 1190.
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design ... Read more
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design ... Read more
Product Details
Format
Hardback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
246
Condition
New
Series
Integrated Circuits and Systems
Number of Pages
246
Place of Publication
New York, NY, United States
ISBN
9781441966056
SKU
V9781441966056
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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