.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
From Contamination to Defects, Faults and Yield Loss
Khare, Jitendra B.; Maly, Wojciech
€ 130.94
FREE Delivery in Ireland
Description for From Contamination to Defects, Faults and Yield Loss
Hardback. States that over the years there has been a large increase in the functionality available on a single integrated circuit. This book focuses on the core of the interface between manufacturing and testing, ie, the contamination-defect-fault relationship. Series: Frontiers in Electronic Testing. Num Pages: 166 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 234 x 156 x 11. Weight in Grams: 930.
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per ... Read more
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per ... Read more
Product Details
Format
Hardback
Publication date
1996
Publisher
Kluwer Academic Publishers United States
Number of pages
166
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
150
Place of Publication
Dordrecht, Netherlands
ISBN
9780792397144
SKU
V9780792397144
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for From Contamination to Defects, Faults and Yield Loss