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Neutron Transmutation Doping in Semiconductors
Jon M. . Ed(S): Meese
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Description for Neutron Transmutation Doping in Semiconductors
Paperback. Editor(s): Meese, Jon M. Num Pages: 372 pages, biography. BIC Classification: THR; TJFD5. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 20. Weight in Grams: 728.
This volume contains the invited and contributed papers presented at the Second International Conference on Neutron Transmutation Doping in Semiconductors held April 23-26, 1978 at the University of Missouri-Columbia. The first "testing of the waters" symposium on this subject was organized by John Cleland and Dick Wood of the Solid-State Division of Oak Ridge National Laboratory in April of 1976, just one year after NTD-silicon appeared on the marketplace. Since this first meeting, NTD-silicon has become established as the starting material for the power device industry and reactor irradiations are now measured in tens of tons of material per annum ... Read more
This volume contains the invited and contributed papers presented at the Second International Conference on Neutron Transmutation Doping in Semiconductors held April 23-26, 1978 at the University of Missouri-Columbia. The first "testing of the waters" symposium on this subject was organized by John Cleland and Dick Wood of the Solid-State Division of Oak Ridge National Laboratory in April of 1976, just one year after NTD-silicon appeared on the marketplace. Since this first meeting, NTD-silicon has become established as the starting material for the power device industry and reactor irradiations are now measured in tens of tons of material per annum ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
372
Condition
New
Number of Pages
372
Place of Publication
New York, NY, United States
ISBN
9781468482515
SKU
V9781468482515
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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