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On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Cui, Qiang; Liou, Juin J.; Hajjar, Jean-Jacques; Salcedo, Javier; Zhou, Yuanzhong
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Description for On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Hardback. On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits Num Pages: 103 pages, 17 black & white illustrations, 42 colour illustrations, 11 black & white tables, biograp. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 8. Weight in Grams: 330.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
Product Details
Format
Hardback
Publication date
2015
Publisher
Springer International Publishing AG Switzerland
Number of pages
103
Condition
New
Number of Pages
86
Place of Publication
Cham, Switzerland
ISBN
9783319108186
SKU
V9783319108186
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Cui, Qiang; Liou, Juin J.; Hajjar, Jean-Jacques; Salcedo, Javier; Zhou, Yuanzhong
Dr. Qiang Cui received his B.S, M.S and PhD in Electrical Engineering in 2006, 2008, 2013 respectively. His research work includes Radio Frequency Integrated Circuits (RFIC) Design and Reliability. His research work has been referenced in publications and also applied to industry application. He is now a senior RF IC design engineer in RF Micro Devices (RFMD). Juin ... Read more
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