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On Line-testing for VLSI
. Ed(S): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K.
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Description for On Line-testing for VLSI
Paperback. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 8. Weight in Grams: 385.
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions ... Read more
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions ... Read more
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
164
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
160
Place of Publication
New York, NY, United States
ISBN
9781441950338
SKU
V9781441950338
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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