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Rapid Reliability Assessment of VLSICs
Dorey, A.P.; Jones, B. K.; Richardson, A. M. D.; Xu, Y. Z.
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Description for Rapid Reliability Assessment of VLSICs
Paperback. Num Pages: 212 pages, biography. BIC Classification: THR; TJFD. Category: (G) General (US: Trade). Dimension: 244 x 170 x 12. Weight in Grams: 381.
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measurements that may reveal those devices more likely to fail. The measurements assessed are of analog circuit parameters which, based on a knowledge of failure mechanisms, may indicate a future failure. . To incorporate these tests into the functional listing of very large scale integrated circuits consideration has to be given to the sensitivity ... Read more
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measurements that may reveal those devices more likely to fail. The measurements assessed are of analog circuit parameters which, based on a knowledge of failure mechanisms, may indicate a future failure. . To incorporate these tests into the functional listing of very large scale integrated circuits consideration has to be given to the sensitivity ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
212
Condition
New
Number of Pages
212
Place of Publication
New York, NY, United States
ISBN
9781461278795
SKU
V9781461278795
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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