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Soh, Hyongsok T.; Guarini, Kathryn Wilder; Quate, Clavin F. - Scanning Probe Lithography - 9780792373612 - V9780792373612
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Scanning Probe Lithography

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Description for Scanning Probe Lithography Hardback. Describes advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. This book describes the historical context, the relevant inventions, and the prospects for eventual manufacturing use of this technology. Series: Microsystems. Num Pages: 197 pages, biography. BIC Classification: TJFD5. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 14. Weight in Grams: 498.
Scanning Probe Lithography (SPL) describes recent advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. SPL is capable of patterning sub-30nm features with nanometer-scale alignment registration. It is a relatively simple, inexpensive, reliable method for patterning nanometer-scale features on various substrates. It has potential applications for nanometer-scale research, for maskless semiconductor lithography, and for photomask patterning.
The authors of this book have been key players in this ... Read more

Product Details

Format
Hardback
Publication date
2001
Publisher
Kluwer Academic Publishers United States
Number of pages
197
Condition
New
Series
Microsystems
Number of Pages
197
Place of Publication
Dordrecht, Netherlands
ISBN
9780792373612
SKU
V9780792373612
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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