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. Ed(S): Christou, A.; Unger, B.A. - Semiconductor Device Reliability - 9780792305361 - V9780792305361
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Semiconductor Device Reliability

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Description for Semiconductor Device Reliability Hardback. Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989 Editor(s): Christou, A.; Unger, B.A. Series: NATO Science Series E:. Num Pages: 585 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 31. Weight in Grams: 1000.
This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their ... Read more

Product Details

Format
Hardback
Publication date
1989
Publisher
Kluwer Academic Publishers United States
Number of pages
585
Condition
New
Series
NATO Science Series E:
Number of Pages
575
Place of Publication
Dordrecht, Netherlands
ISBN
9780792305361
SKU
V9780792305361
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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