Test and Diagnosis for Small-Delay Defects
Tehranipoor, Mohammad; Peng, Kemao; Chakrabarty, Krishnendu
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Description for Test and Diagnosis for Small-Delay Defects
Hardback. This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects. Num Pages: 212 pages, 51 black & white tables, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 14. Weight in Grams: 514.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Product Details
Format
Hardback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
212
Condition
New
Number of Pages
212
Place of Publication
New York, NY, United States
ISBN
9781441982964
SKU
V9781441982964
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Tehranipoor, Mohammad; Peng, Kemao; Chakrabarty, Krishnendu
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply ... Read more
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