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Testing Static Random Access Memories
Said Hamdioui
€ 132.35
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Description for Testing Static Random Access Memories
Hardback. Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation. Series: Frontiers in Electronic Testing. Num Pages: 241 pages, biography. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 520.
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the ... Read more
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the ... Read more
Product Details
Format
Hardback
Publication date
2004
Publisher
Springer-Verlag New York Inc. United States
Number of pages
241
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
221
Place of Publication
New York, NY, United States
ISBN
9781402077524
SKU
V9781402077524
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Testing Static Random Access Memories
From the reviews: "Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. … This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. … The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is ... Read more