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The Core Test Wrapper Handbook. Rationale and Application of IEEE STD. 1500(T).
Silva, Francisco Da; McLaurin, Teresa; Waayers, Tom
€ 200.05
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Description for The Core Test Wrapper Handbook. Rationale and Application of IEEE STD. 1500(T).
Hardback. Provides insight into the rules and recommendations of IEEE Std 1500. This title presents background information about some of the choices and decisions made throughout the design of this IEEE standard conceived to enable efficient core test reuse and debug at the SOC level. Series: Frontiers in Electronic Testing. Num Pages: 305 pages, biography. BIC Classification: THR; TJ. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 19. Weight in Grams: 1360.
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion – a microprocessor is not just about the ... Read more
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion – a microprocessor is not just about the ... Read more
Product Details
Format
Hardback
Publication date
2006
Publisher
Springer-Verlag New York Inc. United States
Number of pages
305
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
276
Place of Publication
New York, NY, United States
ISBN
9780387307510
SKU
V9780387307510
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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