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. Ed(S): Deal, B. E.; Helms, C. Robert - The Physics And Chemistry Of Sio2 And T - 9781489907769 - V9781489907769
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The Physics And Chemistry Of Sio2 And T

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Description for The Physics And Chemistry Of Sio2 And T Paperback. Proceedings of a symposium of the 173rd Meeting of the Electrochemical Society held in Atlanta, Georgia, May 15-20, 1988 Editor(s): Deal, B. E.; Helms, C. Robert. Num Pages: 556 pages, biography. BIC Classification: PNR; PNRH; THR; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 29. Weight in Grams: 866.
The properties of Si02 and the Si-Si02 interface provide the key foundation onto which the majority of semiconductor device technology has been built Their study has consumed countless hours of many hundreds of investigators over the years, not only in the field of semiconductor devices but also in ceramics, materials science, metallurgy, geology, and mineralogy, to name a few. These groups seldom have contact with each other even though they often investigate quite similar aspects of the Si02 system. Desiring to facilitate an interaction between these groups we set out to organize a symposium on the Physics and Chemistry of ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
556
Condition
New
Number of Pages
556
Place of Publication
New York, United States
ISBN
9781489907769
SKU
V9781489907769
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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