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Unified Approach for Timing Verification and Delay Fault Testing
Sivaraman, Mukund; Strojwas, Andrzej J.
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Description for Unified Approach for Timing Verification and Delay Fault Testing
Hardback. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426.
Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts.
A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis ... Read more
Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts.
A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis ... Read more
Product Details
Format
Hardback
Publication date
1997
Publisher
Kluwer Academic Publishers United States
Number of pages
155
Condition
New
Number of Pages
155
Place of Publication
Dordrecht, Netherlands
ISBN
9780792380795
SKU
V9780792380795
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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