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Ellipsometry at the Nanoscale
. Ed(S): Losurdo, Maria; Hingerl, Kurt
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Description for Ellipsometry at the Nanoscale
Hardback. This book examines ellipsometry in nanoscience and nanotechnology. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving the science and technology of nanomaterials and related processes. Editor(s): Losurdo, Maria; Hingerl, Kurt. Num Pages: 754 pages, biography. BIC Classification: PDDM; TBN; TDPB; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 44. Weight in Grams: 1280.
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry ... Read more
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry ... Read more
Product Details
Format
Hardback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
754
Condition
New
Number of Pages
730
Place of Publication
Berlin, Germany
ISBN
9783642339554
SKU
V9783642339554
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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