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Jay N. Zemel (Ed.) - Nondestructive Evaluation of Semiconductor Materials and Devices - 9781475713541 - V9781475713541
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Nondestructive Evaluation of Semiconductor Materials and Devices

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Description for Nondestructive Evaluation of Semiconductor Materials and Devices Paperback. Editor(s): Zemel, Jay N. Series: NATO Science Series B. Num Pages: 782 pages, biography. BIC Classification: THR. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 40. Weight in Grams: 1345.
From September 19-29, a NATO Advanced Study Institute on Non- destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele- rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this ... Read more

Product Details

Publisher
Springer-Verlag New York Inc. United States
Number of pages
782
Format
Paperback
Publication date
2013
Series
NATO Science Series B
Condition
New
Weight
1346g
Number of Pages
782
Place of Publication
New York, NY, United States
ISBN
9781475713541
SKU
V9781475713541
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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