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Field-Ion Microscopy
R. Wagner
€ 126.32
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Description for Field-Ion Microscopy
Paperback. Series: Crystals. Num Pages: 118 pages, biography. BIC Classification: PNFC; PNFS; PNK. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 7. Weight in Grams: 241.
Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller!) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single atoms imaged in the FIM2). Originally the motivation to develop the ToF atom probe was ... Read more
Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller!) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single atoms imaged in the FIM2). Originally the motivation to develop the ToF atom probe was ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
118
Condition
New
Series
Crystals
Number of Pages
118
Place of Publication
Berlin, Germany
ISBN
9783642686894
SKU
V9783642686894
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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