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Handbook of Sample Preparation for Scanning Electron Microscopy and X-ray Microanalysis
Patrick Echlin
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Description for Handbook of Sample Preparation for Scanning Electron Microscopy and X-ray Microanalysis
Hardcover. Here is a complete guide to preparing a variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors. Num Pages: 344 pages, 159 colour illustrations, 69 colour tables, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 23. Weight in Grams: 919.
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of ... Read more
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of ... Read more
Product Details
Publisher
Springer-Verlag New York Inc. United States
Number of pages
344
Format
Hardback
Publication date
2009
Condition
New
Weight
919g
Number of Pages
332
Place of Publication
New York, NY, United States
ISBN
9780387857305
SKU
V9780387857305
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Patrick Echlin
Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He ... Read more
Reviews for Handbook of Sample Preparation for Scanning Electron Microscopy and X-ray Microanalysis
This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential ... Read more