Helium Ion Microscopy
David C. Joy
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Description for Helium Ion Microscopy
Paperback. Series: SpringerBriefs in Materials. Num Pages: 72 pages, 13 black & white illustrations, 16 colour illustrations, 2 black & white tables, biography. BIC Classification: PNFS; TBN; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 8. Weight in Grams: 155.
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields ... Read more
Show LessProduct Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
72
Condition
New
Series
SpringerBriefs in Materials
Number of Pages
64
Place of Publication
New York, NY, United States
ISBN
9781461486596
SKU
V9781461486596
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Helium Ion Microscopy
From the reviews: “Helium Ion Microscopy, Principles and Applications, is a compact volume of 64 pages, and is useful to anyone wishing fundamental knowledge on this topic. … There are many features of this book that make it a useful resource for both the beginning and advanced microscopist. … this book provides a novice researcher an initial resource to ... Read more