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High-resolution Electron Microscopy
John C. H. Spence
€ 212.93
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Description for High-resolution Electron Microscopy
This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It covers the usefulness of seeing atoms in the semiconductor industry, in materials science, in condensed matter physics, and in biology. Num Pages: 432 pages, 163 b/w illustrations, 4 colour plates. BIC Classification: PDND; PHFC; PNT; TGM. Category: (P) Professional & Vocational. Dimension: 249 x 176 x 27. Weight in Grams: 1028.
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, ... Read more
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, ... Read more
Product Details
Publication date
2013
Publisher
Oxford University Press United Kingdom
Number of pages
432
Condition
New
Number of Pages
432
Format
Hardback
Place of Publication
Oxford, United Kingdom
ISBN
9780199668632
SKU
V9780199668632
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-1
About John C. H. Spence
John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American ... Read more
Reviews for High-resolution Electron Microscopy
... Essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques.
Jian-Min Zuo, Microscopy & Microanalysis
Jian-Min Zuo, Microscopy & Microanalysis