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High-resolution X-ray Scattering
Pietsch, Ulrich; Holy, Vaclav; Baumbach, Tilo
€ 152.51
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Description for High-resolution X-ray Scattering
Hardback. The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Series: Advanced Texts in Physics. Num Pages: 424 pages, 389 black & white illustrations, biography. BIC Classification: PHF. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 234 x 156 x 23. Weight in Grams: 774.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is ... Read more
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is ... Read more
Product Details
Format
Hardback
Publication date
2004
Publisher
Springer-Verlag New York Inc. United States
Number of pages
424
Condition
New
Series
Advanced Texts in Physics
Number of Pages
408
Place of Publication
New York, NY, United States
ISBN
9780387400921
SKU
V9780387400921
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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