Stock image for illustration purposes only - book cover, edition or condition may vary.
Hot Carrier Reliability of MOS VLSI Circuits
Leblebici, Yusuf; Kang, Sung-Mo
€ 236.48
FREE Delivery in Ireland
Description for Hot Carrier Reliability of MOS VLSI Circuits
Hardback. Addresses the issues related to hot-carrier reliability of MOS VLSI circuits.This book is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 212 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 14. Weight in Grams: 509.
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of ... Read more
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of ... Read more
Product Details
Format
Hardback
Publication date
1993
Publisher
Kluwer Academic Publishers United States
Number of pages
212
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
212
Place of Publication
Dordrecht, Netherlands
ISBN
9780792393528
SKU
V9780792393528
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Hot Carrier Reliability of MOS VLSI Circuits