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Image-Based Fractal Description of Microstructures
Li, J.M.; Lu, Li; Lai, Man On; Ralph, B.
€ 128.55
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Description for Image-Based Fractal Description of Microstructures
Hardback. Fractal analysis has become an important field in materials science and engineering with applications to theoretical analysis and quantitative description of microstructures of materials. This book attempts to introduce the fundamentals and the basic methods of fractal description of microstructures, with digital imaging and computer technologies. Num Pages: 272 pages, biography. BIC Classification: TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 17. Weight in Grams: 586.
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin ... Read more
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin ... Read more
Product Details
Format
Hardback
Publication date
2003
Publisher
Kluwer Academic Publishers United States
Number of pages
272
Condition
New
Number of Pages
272
Place of Publication
New York, NY, United States
ISBN
9781402075070
SKU
V9781402075070
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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