×


 x 

Shopping cart
Larsson, Erik (Linkoping University, Sweden) - Introduction to Advanced System-on-Chip Test Design and Optimization - 9781402032073 - V9781402032073
Stock image for illustration purposes only - book cover, edition or condition may vary.

Introduction to Advanced System-on-Chip Test Design and Optimization

€ 202.02
FREE Delivery in Ireland
Description for Introduction to Advanced System-on-Chip Test Design and Optimization hardcover. Testing of Integrated Circuits is important to ensure the production of fault-free chips. This book deals with SOC test design and its optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. Series: Frontiers in Electronic Testing. Num Pages: 388 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 232 x 156 x 23. Weight in Grams: 752.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, ... Read more

Show Less

Product Details

Format
Hardback
Publication date
2005
Publisher
Springer United States
Number of pages
388
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
388
Place of Publication
New York, NY, United States
ISBN
9781402032073
SKU
V9781402032073
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Larsson, Erik (Linkoping University, Sweden)
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies

Reviews for Introduction to Advanced System-on-Chip Test Design and Optimization

Goodreads reviews for Introduction to Advanced System-on-Chip Test Design and Optimization


Subscribe to our newsletter

News on special offers, signed editions & more!