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Ion Beam Surface Layer Analysis
Otto . Ed(S): Meyer
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Description for Ion Beam Surface Layer Analysis
paperback. Editor(s): Meyer, Otto. Num Pages: 491 pages, biography. BIC Classification: PHFC; PHN. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 26. Weight in Grams: 964.
The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con ferences: "Application of Ion-Beams to Materials" at Warwick, Eng land and "Atomic Collisions in Solids" at Amsterdam, the Nether lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no ... Read more
The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con ferences: "Application of Ion-Beams to Materials" at Warwick, Eng land and "Atomic Collisions in Solids" at Amsterdam, the Nether lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
491
Condition
New
Number of Pages
491
Place of Publication
New York, NY, United States
ISBN
9781461588818
SKU
V9781461588818
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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