.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Leakage in Nanometer CMOS Technologies
. Ed(S): Narendra, Siva G.; Chandrakasan, Anantha P.
€ 194.29
FREE Delivery in Ireland
Description for Leakage in Nanometer CMOS Technologies
Paperback. Editor(s): Narendra, Siva G.; Chandrakasan, Anantha P. Series: Integrated Circuits and Systems. Num Pages: 308 pages, biography. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 17. Weight in Grams: 492.
Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is computing) is becoming significant compared to switching power. In battery operated systems, standby leakage (i.e., ... Read more
Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is computing) is becoming significant compared to switching power. In battery operated systems, standby leakage (i.e., ... Read more
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
308
Condition
New
Series
Integrated Circuits and Systems
Number of Pages
308
Place of Publication
New York, NY, United States
ISBN
9781441938268
SKU
V9781441938268
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Leakage in Nanometer CMOS Technologies