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Levy Processes and Their Applications in Reliability and Storage
Mohamed S. Abdel-Hameed
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Description for Levy Processes and Their Applications in Reliability and Storage
Paperback. Series: SpringerBriefs in Statistics. Num Pages: 116 pages, biography. BIC Classification: PBT; TGP. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 213.
This book covers Lévy processes and their applications in the contexts of reliability and storage. Special attention is paid to life distributions and the maintenance of devices subject to degradation; estimating the parameters of the degradation process is also discussed, as is the maintenance of dams subject to Lévy input.
This book covers Lévy processes and their applications in the contexts of reliability and storage. Special attention is paid to life distributions and the maintenance of devices subject to degradation; estimating the parameters of the degradation process is also discussed, as is the maintenance of dams subject to Lévy input.
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
116
Condition
New
Series
SpringerBriefs in Statistics
Number of Pages
116
Place of Publication
Berlin, Germany
ISBN
9783642400742
SKU
V9783642400742
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Mohamed S. Abdel-Hameed
Professor Mohamed Abdel-Hameed is a former Chair of the Department of Statistics and Operations Research, Kuwait University. He has served on the editorial board of the Journal of Applied Stochastic Models and Data Analysis and is the Editor (jointly with E. Cinlar and J. Quinn) of the book Reliability Theory and Models: Stochastic Failure Models, Optimal Maintenance Policies, Life Testing ... Read more
Reviews for Levy Processes and Their Applications in Reliability and Storage
From the book reviews: “This is a short book and contains three chapters only. Each chapter can be seen as a review article on a specific topic. … it can be recommended as a quick introduction to reliability and storage analysis using Lévy processes.” (Enrico Scalas, Mathematical Reviews, February, 2015)