Stock image for illustration purposes only - book cover, edition or condition may vary.
Material Characterization Using Ion Beams
J. . Ed(S): Thomas
€ 65.38
FREE Delivery in Ireland
Description for Material Characterization Using Ion Beams
Paperback. Editor(s): Thomas, J. Series: NATO Science Series B. Num Pages: 535 pages, 79 black & white illustrations. BIC Classification: PHFC. Category: (G) General (US: Trade). Dimension: 244 x 170 x 27. Weight in Grams: 913.
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted ... Read more
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted ... Read more
Product Details
Format
Paperback
Publication date
1978
Publisher
Springer-Verlag New York Inc. United States
Number of pages
535
Condition
New
Series
NATO Science Series B
Number of Pages
517
Place of Publication
New York, NY, United States
ISBN
9781468408584
SKU
V9781468408584
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Material Characterization Using Ion Beams