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Advanced Computing in Electron Microscopy
Earl J. Kirkland
€ 138.91
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Description for Advanced Computing in Electron Microscopy
paperback. This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references. Num Pages: 299 pages, 25 black & white tables, biography. BIC Classification: PNFS; TGMT; THR; UYA. Category: (G) General (US: Trade). Dimension: 235 x 155 x 16. Weight in Grams: 462.
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/˜kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 ... Read more
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/˜kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 ... Read more
Product Details
Format
Paperback
Publication date
2014
Publisher
Springer United States
Number of pages
299
Condition
New
Number of Pages
289
Place of Publication
New York, United States
ISBN
9781489995094
SKU
V9781489995094
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Advanced Computing in Electron Microscopy
From the reviews of the second edition: “It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)