Digital Holography for MEMS and Microsystem Metrology
Anand Asundi
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Description for Digital Holography for MEMS and Microsystem Metrology
Hardcover. By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection. Editor(s): Asundi, Anand. Series: Microsystem and Nanotechnology Series (ME20). Num Pages: 232 pages, Illustrations. BIC Classification: TGMT1; TJ. Category: (P) Professional & Vocational. Dimension: 237 x 164 x 19. Weight in Grams: 486.
Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into ... Read more
Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into ... Read more
Product Details
Format
Hardback
Publication date
2011
Publisher
John Wiley and Sons Ltd United Kingdom
Number of pages
232
Condition
New
Series
Microsystem and Nanotechnology Series (ME20)
Number of Pages
232
Place of Publication
New York, United States
ISBN
9780470978696
SKU
V9780470978696
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-1
About Anand Asundi
Anand Asundi, Nanyang Technological University, Singapore Anand Asundi is Professor and Deputy Director of the Advanced Materials Research Centre at Nanyang Technological University in Singapore. His research interests are in photomechanics and optical sensors & he has published over 200 papers in peer-reviewed journals and presented invited and plenary talks at international conferences. He has also chaired and organized ... Read more
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