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Microstructural Characterization of Materials
David Brandon
€ 69.35
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Description for Microstructural Characterization of Materials
Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Num Pages: 550 pages, black & white illustrations, colour illustrations, black & white tables, figures. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 245 x 169 x 30. Weight in Grams: 914.
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.
Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of ... Read more
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.
Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of ... Read more
Product Details
Format
Paperback
Publication date
2008
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
550
Condition
New
Number of Pages
560
Place of Publication
New York, United States
ISBN
9780470027851
SKU
V9780470027851
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About David Brandon
David Brandon, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley. Wayne D. Kaplan, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley.
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