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Bias Temperature Instability for Devices and Circuits
Grasser Tibor
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Description for Bias Temperature Instability for Devices and Circuits
Hardcover. Bias Temperature Instability for Devices and Circuits Editor(s): Grasser, Tibor (Technical University of Vienna, Austria). Num Pages: 821 pages, 283 black & white illustrations, 318 colour illustrations, 22 black & white tables, biogr. BIC Classification: TGPR; TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 241 x 158 x 50. Weight in Grams: 1526.
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Product Details
Format
Hardback
Publication date
2013
Publisher
Springer
Condition
New
Number of Pages
810
Place of Publication
New York, NY, United States
ISBN
9781461479086
SKU
V9781461479086
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-1
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