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Resonant X-Ray Scattering in Correlated Systems
. Ed(S): Murakami, Youichi; Ishihara, Sumio
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Description for Resonant X-Ray Scattering in Correlated Systems
Hardback. Editor(s): Murakami, Youichi; Ishihara, Sumio. Series: Springer Tracts in Modern Physics. Num Pages: 241 pages, 126 black & white illustrations, 25 colour illustrations, biography. BIC Classification: PHFC; PNFS; TDPB; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 16. Weight in Grams: 543.
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
Product Details
Format
Hardback
Publication date
2017
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
241
Condition
New
Series
Springer Tracts in Modern Physics
Number of Pages
241
Place of Publication
Berlin, Germany
ISBN
9783662532256
SKU
V9783662532256
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About . Ed(S): Murakami, Youichi; Ishihara, Sumio
Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan. Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.
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