Stock image for illustration purposes only - book cover, edition or condition may vary.
Transmission Electron Microscopy and Diffractometry of Materials
Fultz, Brent; Howe, James M.
€ 115.21
FREE Delivery in Ireland
Description for Transmission Electron Microscopy and Diffractometry of Materials
Paperback. This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis. Series: Graduate Texts in Physics. Num Pages: 784 pages, biography. BIC Classification: PHFC; PNFS; TGM; TGMT. Category: (G) General (US: Trade). Dimension: 237 x 156 x 44. Weight in Grams: 1154.
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder ... Read more
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
784
Condition
New
Series
Graduate Texts in Physics
Number of Pages
764
Place of Publication
Berlin, Germany
ISBN
9783642433153
SKU
V9783642433153
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Fultz, Brent; Howe, James M.
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials. James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy ... Read more
Reviews for Transmission Electron Microscopy and Diffractometry of Materials
``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray ... Read more