Stock image for illustration purposes only - book cover, edition or condition may vary.
X-Ray Spectrometry in Electron Beam Instruments
Joseph I. Goldstein (Ed.)
€ 239.48
FREE Delivery in Ireland
Description for X-Ray Spectrometry in Electron Beam Instruments
Paperback. Editor(s): Goldstein, Joseph I.; Newbury, Dale E. (National Institute of Standards and Technology, Gaithersburg, MD, USA); Williams, David B. Num Pages: 372 pages, biography. BIC Classification: PNF; PS; TGMT. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 21. Weight in Grams: 751.
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative ... Read more
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative ... Read more
Product Details
Publisher
Springer-Verlag New York Inc. United States
Number of pages
372
Format
Paperback
Publication date
2012
Condition
New
Weight
731g
Number of Pages
372
Place of Publication
New York, NY, United States
ISBN
9781461357384
SKU
V9781461357384
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for X-Ray Spectrometry in Electron Beam Instruments
`[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.' from the Foreword by Peter Duncumb, University of Cambridge, England `Contains a vast amount of detailed information and will surely be heavily used.' Ultramicroscopy