Nanometer-Scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
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Description for Nanometer-Scale Defect Detection Using Polarized Light
Hardback. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622.
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at ... Read more
Show LessProduct Details
Format
Hardback
Publication date
2016
Publisher
ISTE Ltd and John Wiley & Sons Inc United Kingdom
Number of pages
316
Condition
New
Number of Pages
316
Place of Publication
London, United Kingdom
ISBN
9781848219366
SKU
V9781848219366
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Pierre-Richard Dahoo
Pierre Richard Dahoo is Professor at the University of Versailles Saint-Quentin in France. His research interests include absorption spectroscopy, laser-induced fluorescence, ellipsometry, optical molecules, industrial materials, modeling and simulation. He is program manager of the Chair Materials Simulation and Engineering of UVSQ. Philippe Pougnet is a Doctor in Engineering. He is an expert in reliability and product-process technology ... Read more
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