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Francis Balestra - Nanoscale CMOS: Innovative Materials, Modeling and Characterization - 9781848211803 - V9781848211803
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Nanoscale CMOS: Innovative Materials, Modeling and Characterization

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Description for Nanoscale CMOS: Innovative Materials, Modeling and Characterization Hardback. Editor(s): Balestra, Francis. Num Pages: 672 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 162 x 41. Weight in Grams: 1108.

This book provides a comprehensive review of the state-of-the-art in the development of new and innovative materials, and of advanced modeling and characterization methods for nanoscale CMOS devices.

Leading global industry bodies including the International Technology Roadmap for Semiconductors (ITRS) have created a forecast of performance improvements that will be delivered in the foreseeable future – in the form of a roadmap that will lead to a substantial enlargement in the number of materials, technologies and device architectures used in CMOS devices. This book addresses the field of materials development, which has been the subject of a major research drive ... Read more

The book also provides information on the most appropriate modeling and simulation methods for electrical properties of advanced MOSFETs, including ballistic transport, gate leakage, atomistic simulation, and compact models for single and multi-gate devices, nanowire and carbon-based FETs. Finally, the book presents an in-depth investigation of the main nanocharacterization techniques that can be used for an accurate determination of transport parameters, interface defects, channel strain as well as RF properties, including capacitance-conductance, improved split C-V, magnetoresistance, charge pumping, low frequency noise, and Raman spectroscopy.

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Product Details

Format
Hardback
Publication date
2010
Publisher
ISTE Ltd and John Wiley & Sons Inc United Kingdom
Number of pages
544
Condition
New
Number of Pages
652
Place of Publication
London, United Kingdom
ISBN
9781848211803
SKU
V9781848211803
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Francis Balestra
Francis Balestra is Director of the Laboratoire de Physique des Composants - Semiconducteurs (LPCS) at INP Grenoble in France. He has coauthored over 80 publications in international scientific journals and 120 communications at national and international conferences (20 invited papers and review articles).

Reviews for Nanoscale CMOS: Innovative Materials, Modeling and Characterization
"All illustrations including half-tone impressions, graphs, tables and mathematical equations are presented in a manner the design and execution of which are as excellent as the material they go to serve and illustrate." (Current Engineering Practice, 2011)

Goodreads reviews for Nanoscale CMOS: Innovative Materials, Modeling and Characterization


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