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Nanoscale Memory Repair
Horiguchi, Masashi; Itoh, Kiyoo
€ 198.34
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Description for Nanoscale Memory Repair
Hardback. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478.
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Product Details
Format
Hardback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
218
Condition
New
Series
Integrated Circuits and Systems
Number of Pages
218
Place of Publication
New York, NY, United States
ISBN
9781441979575
SKU
V9781441979575
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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