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. Ed(S): Morita, Seizo; Giessibl, Franz J.; Wiesendanger, Roland - Noncontact Atomic Force Microscopy - 9783642014949 - V9783642014949
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Noncontact Atomic Force Microscopy

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Description for Noncontact Atomic Force Microscopy Hardback. This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more. Editor(s): Morita, Seizo; Giessibl, Franz J.; Wiesendanger, Roland. Series: Nanoscience and Technology. Num Pages: 419 pages, 28 black & white illustrations, 77 colour illustrations, 7 black & white tables, biograph. BIC Classification: PHFC; TBC; TBN. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 25. Weight in Grams: 866.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding ... Read more

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Product Details

Format
Hardback
Publication date
2009
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
419
Condition
New
Series
Nanoscience and Technology
Number of Pages
401
Place of Publication
Berlin, Germany
ISBN
9783642014949
SKU
V9783642014949
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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