"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids . . . There are unsolved questions about ... Read morethe mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise . . . With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future." –Materials Today Show Less